Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells
Identifieur interne : 000835 ( Main/Repository ); précédent : 000834; suivant : 000836Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells
Auteurs : RBID : Pascal:13-0193136Descripteurs français
- Pascal (Inist)
- Essai non destructif, Mappage, Epaisseur, Cellule solaire organique, Cellule solaire, Enregistrement, Incidence normale, Algorithme, Etude comparative, Spectre absorption, Robustesse, Implémentation, Revêtement centrifugation, Couche ITO, Addition étain, Dépôt centrifugation, Matrice formage, Revêtement protecteur, Valeur nominale, Spectrométrie réflexion, Métadonnée, Thiophène dérivé polymère, Acide butyrique, Ester, Composé du fullerène, Oxyde d'indium, Matériau revêtu, Verre flotté, Ethylène téréphtalate polymère, ITO, Procédé roll-to-roll.
English descriptors
- KwdEn :
- Absorption spectrum, Algorithm, Butyric acid, Coated material, Comparative study, Die, Ester, Ethylene terephthalate polymer, Float glass, Fullerene compounds, ITO layers, Implementation, Indium oxide, Mapping, Metadata, Nominal value, Non destructive test, Normal incidence, Organic solar cells, Protective coatings, Recording, Reflection spectrometry, Robustness, Roll-to-roll process, Solar cell, Spin-on coating, Spin-on coatings, Thickness, Thiophene derivative polymer, Tin addition.
Abstract
Non-destructive lateral mapping of the thickness of the photoactive layer in poly(3-hexyl-thiophene): 1-(3-methoxy-carbonyl) propyl-1-phenyl-(6,6)C61 (P3HT: PCBM) solar cells is demonstrated. The method employs a spatially resolved (XY) recording of ultraviolet-visible spectra in reflection geometry at normal incidence, using a dense raster defined by a circular probe spot of 800-μm diameter. The evaluation of the thickness of the photoactive layer at each raster point employs an algorithm-driven comparison of the measured absorption spectrum with spectral features, as compiled from the corresponding simulated spectrum. For the robustness of the applied algorithm toward noise in the recorded absorption data to be increased, a new minimum finder algorithm is described and implemented. The thickness evaluation relies on the correct assignment of extrema in the experimental absorption spectra to the corresponding extrema in the simulated absorption spectra, and a new algorithm for this is also implemented and described. For a level of confidence for the method to be established, first thickness mapping is performed for a set of reference samples consisting of P3HT: PCBM spin-coated on indium tin oxide-coated float glass substrates. After this, two application examples for solar cells processed either by spin coating or slot die coating of the P3HT: PCBM layer follow. The spin-coated solar cells have glass as the substrate with the P3HT: PCBM spun at different spinning speeds. The slot die-coated solar cells were processed on polyethylene terephthalate foil in a roll-to-roll experiment involving a continuously changing P3HT: PCBM concentration along the printing direction.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells</title><author><name sortKey="Sylvester Hvid, Kristian O" uniqKey="Sylvester Hvid K">Kristian O. Sylvester-Hvid</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399</s1><s2>4000 Roskilde</s2><s3>DNK</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Danemark</country><wicri:noRegion>4000 Roskilde</wicri:noRegion></affiliation></author><author><name sortKey="Tromholt, Thomas" uniqKey="Tromholt T">Thomas Tromholt</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399</s1><s2>4000 Roskilde</s2><s3>DNK</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Danemark</country><wicri:noRegion>4000 Roskilde</wicri:noRegion></affiliation></author><author><name sortKey="J Rgensen, Mikkel" uniqKey="J Rgensen M">Mikkel J Rgensen</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399</s1><s2>4000 Roskilde</s2><s3>DNK</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Danemark</country><wicri:noRegion>4000 Roskilde</wicri:noRegion></affiliation></author><author><name sortKey="Krebs, Frederik C" uniqKey="Krebs F">Frederik C. Krebs</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399</s1><s2>4000 Roskilde</s2><s3>DNK</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Danemark</country><wicri:noRegion>4000 Roskilde</wicri:noRegion></affiliation></author><author><name sortKey="Niggemann, Michael" uniqKey="Niggemann M">Michael Niggemann</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Department of Physics, Cavendish Laboratory, J. J. Thomson Avenue</s1><s2>Cambridge CB3 0HE</s2><s3>GBR</s3><sZ>5 aut.</sZ></inist:fA14><country>Royaume-Uni</country><wicri:noRegion>Cambridge CB3 0HE</wicri:noRegion></affiliation></author><author><name sortKey="Zimmermann, Klaus" uniqKey="Zimmermann K">Klaus Zimmermann</name><affiliation wicri:level="3"><inist:fA14 i1="03"><s1>Freiburg Materials Research Center, University of Freiburg, Stefan-Meier-Strasse 21</s1><s2>79104 Freiburg im Breisgau</s2><s3>DEU</s3><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>Allemagne</country><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Fribourg-en-Brisgau</region><settlement type="city">Fribourg-en-Brisgau</settlement></placeName></affiliation></author><author><name sortKey="Liehr, Andreas W" uniqKey="Liehr A">Andreas W. Liehr</name><affiliation wicri:level="3"><inist:fA14 i1="03"><s1>Freiburg Materials Research Center, University of Freiburg, Stefan-Meier-Strasse 21</s1><s2>79104 Freiburg im Breisgau</s2><s3>DEU</s3><sZ>6 aut.</sZ><sZ>7 aut.</sZ></inist:fA14><country>Allemagne</country><placeName><region type="land" nuts="1">Bade-Wurtemberg</region><region type="district" nuts="2">District de Fribourg-en-Brisgau</region><settlement type="city">Fribourg-en-Brisgau</settlement></placeName></affiliation></author></titleStmt><publicationStmt><idno type="inist">13-0193136</idno><date when="2013">2013</date><idno type="stanalyst">PASCAL 13-0193136 INIST</idno><idno type="RBID">Pascal:13-0193136</idno><idno type="wicri:Area/Main/Corpus">000D28</idno><idno type="wicri:Area/Main/Repository">000835</idno></publicationStmt><seriesStmt><idno type="ISSN">1062-7995</idno><title level="j" type="abbreviated">Prog. photovolt.</title><title level="j" type="main">Progress in photovoltaics</title></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Absorption spectrum</term><term>Algorithm</term><term>Butyric acid</term><term>Coated material</term><term>Comparative study</term><term>Die</term><term>Ester</term><term>Ethylene terephthalate polymer</term><term>Float glass</term><term>Fullerene compounds</term><term>ITO layers</term><term>Implementation</term><term>Indium oxide</term><term>Mapping</term><term>Metadata</term><term>Nominal value</term><term>Non destructive test</term><term>Normal incidence</term><term>Organic solar cells</term><term>Protective coatings</term><term>Recording</term><term>Reflection spectrometry</term><term>Robustness</term><term>Roll-to-roll process</term><term>Solar cell</term><term>Spin-on coating</term><term>Spin-on coatings</term><term>Thickness</term><term>Thiophene derivative polymer</term><term>Tin addition</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Essai non destructif</term><term>Mappage</term><term>Epaisseur</term><term>Cellule solaire organique</term><term>Cellule solaire</term><term>Enregistrement</term><term>Incidence normale</term><term>Algorithme</term><term>Etude comparative</term><term>Spectre absorption</term><term>Robustesse</term><term>Implémentation</term><term>Revêtement centrifugation</term><term>Couche ITO</term><term>Addition étain</term><term>Dépôt centrifugation</term><term>Matrice formage</term><term>Revêtement protecteur</term><term>Valeur nominale</term><term>Spectrométrie réflexion</term><term>Métadonnée</term><term>Thiophène dérivé polymère</term><term>Acide butyrique</term><term>Ester</term><term>Composé du fullerène</term><term>Oxyde d'indium</term><term>Matériau revêtu</term><term>Verre flotté</term><term>Ethylène téréphtalate polymère</term><term>ITO</term><term>Procédé roll-to-roll</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Non-destructive lateral mapping of the thickness of the photoactive layer in poly(3-hexyl-thiophene): 1-(3-methoxy-carbonyl) propyl-1-phenyl-(6,6)C<sub>61</sub> (P3HT: PCBM) solar cells is demonstrated. The method employs a spatially resolved (XY) recording of ultraviolet-visible spectra in reflection geometry at normal incidence, using a dense raster defined by a circular probe spot of 800-μm diameter. The evaluation of the thickness of the photoactive layer at each raster point employs an algorithm-driven comparison of the measured absorption spectrum with spectral features, as compiled from the corresponding simulated spectrum. For the robustness of the applied algorithm toward noise in the recorded absorption data to be increased, a new minimum finder algorithm is described and implemented. The thickness evaluation relies on the correct assignment of extrema in the experimental absorption spectra to the corresponding extrema in the simulated absorption spectra, and a new algorithm for this is also implemented and described. For a level of confidence for the method to be established, first thickness mapping is performed for a set of reference samples consisting of P3HT: PCBM spin-coated on indium tin oxide-coated float glass substrates. After this, two application examples for solar cells processed either by spin coating or slot die coating of the P3HT: PCBM layer follow. The spin-coated solar cells have glass as the substrate with the P3HT: PCBM spun at different spinning speeds. The slot die-coated solar cells were processed on polyethylene terephthalate foil in a roll-to-roll experiment involving a continuously changing P3HT: PCBM concentration along the printing direction.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>1062-7995</s0></fA01><fA03 i2="1"><s0>Prog. photovolt.</s0></fA03><fA05><s2>21</s2></fA05><fA06><s2>4</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Non-destructive lateral mapping of the thickness of the photoactive layer in polymer-based solar cells</s1></fA08><fA11 i1="01" i2="1"><s1>SYLVESTER-HVID (Kristian O.)</s1></fA11><fA11 i1="02" i2="1"><s1>TROMHOLT (Thomas)</s1></fA11><fA11 i1="03" i2="1"><s1>JØRGENSEN (Mikkel)</s1></fA11><fA11 i1="04" i2="1"><s1>KREBS (Frederik C.)</s1></fA11><fA11 i1="05" i2="1"><s1>NIGGEMANN (Michael)</s1></fA11><fA11 i1="06" i2="1"><s1>ZIMMERMANN (Klaus)</s1></fA11><fA11 i1="07" i2="1"><s1>LIEHR (Andreas W.)</s1></fA11><fA14 i1="01"><s1>Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399</s1><s2>4000 Roskilde</s2><s3>DNK</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></fA14><fA14 i1="02"><s1>Department of Physics, Cavendish Laboratory, J. J. Thomson Avenue</s1><s2>Cambridge CB3 0HE</s2><s3>GBR</s3><sZ>5 aut.</sZ></fA14><fA14 i1="03"><s1>Freiburg Materials Research Center, University of Freiburg, Stefan-Meier-Strasse 21</s1><s2>79104 Freiburg im Breisgau</s2><s3>DEU</s3><sZ>6 aut.</sZ><sZ>7 aut.</sZ></fA14><fA20><s1>402-419</s1></fA20><fA21><s1>2013</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>26755</s2><s5>354000174777700020</s5></fA43><fA44><s0>0000</s0><s1>© 2013 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>14 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>13-0193136</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Progress in photovoltaics</s0></fA64><fA66 i1="01"><s0>GBR</s0></fA66><fC01 i1="01" l="ENG"><s0>Non-destructive lateral mapping of the thickness of the photoactive layer in poly(3-hexyl-thiophene): 1-(3-methoxy-carbonyl) propyl-1-phenyl-(6,6)C<sub>61</sub> (P3HT: PCBM) solar cells is demonstrated. The method employs a spatially resolved (XY) recording of ultraviolet-visible spectra in reflection geometry at normal incidence, using a dense raster defined by a circular probe spot of 800-μm diameter. The evaluation of the thickness of the photoactive layer at each raster point employs an algorithm-driven comparison of the measured absorption spectrum with spectral features, as compiled from the corresponding simulated spectrum. For the robustness of the applied algorithm toward noise in the recorded absorption data to be increased, a new minimum finder algorithm is described and implemented. The thickness evaluation relies on the correct assignment of extrema in the experimental absorption spectra to the corresponding extrema in the simulated absorption spectra, and a new algorithm for this is also implemented and described. For a level of confidence for the method to be established, first thickness mapping is performed for a set of reference samples consisting of P3HT: PCBM spin-coated on indium tin oxide-coated float glass substrates. After this, two application examples for solar cells processed either by spin coating or slot die coating of the P3HT: PCBM layer follow. The spin-coated solar cells have glass as the substrate with the P3HT: PCBM spun at different spinning speeds. The slot die-coated solar cells were processed on polyethylene terephthalate foil in a roll-to-roll experiment involving a continuously changing P3HT: PCBM concentration along the printing direction.</s0></fC01><fC02 i1="01" i2="X"><s0>001D06C02D1</s0></fC02><fC02 i1="02" i2="X"><s0>230</s0></fC02><fC03 i1="01" i2="X" l="FRE"><s0>Essai non destructif</s0><s5>01</s5></fC03><fC03 i1="01" i2="X" l="ENG"><s0>Non destructive test</s0><s5>01</s5></fC03><fC03 i1="01" i2="X" l="SPA"><s0>Ensayo no destructivo</s0><s5>01</s5></fC03><fC03 i1="02" i2="X" l="FRE"><s0>Mappage</s0><s5>02</s5></fC03><fC03 i1="02" i2="X" l="ENG"><s0>Mapping</s0><s5>02</s5></fC03><fC03 i1="02" i2="X" l="SPA"><s0>Carta de datos</s0><s5>02</s5></fC03><fC03 i1="03" i2="X" l="FRE"><s0>Epaisseur</s0><s5>03</s5></fC03><fC03 i1="03" i2="X" l="ENG"><s0>Thickness</s0><s5>03</s5></fC03><fC03 i1="03" i2="X" l="SPA"><s0>Espesor</s0><s5>03</s5></fC03><fC03 i1="04" i2="3" l="FRE"><s0>Cellule solaire 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l="ENG"><s0>Nominal value</s0><s5>19</s5></fC03><fC03 i1="19" i2="X" l="SPA"><s0>Valor nominal</s0><s5>19</s5></fC03><fC03 i1="20" i2="X" l="FRE"><s0>Spectrométrie réflexion</s0><s5>20</s5></fC03><fC03 i1="20" i2="X" l="ENG"><s0>Reflection spectrometry</s0><s5>20</s5></fC03><fC03 i1="20" i2="X" l="SPA"><s0>Espectrometría reflexión</s0><s5>20</s5></fC03><fC03 i1="21" i2="X" l="FRE"><s0>Métadonnée</s0><s5>21</s5></fC03><fC03 i1="21" i2="X" l="ENG"><s0>Metadata</s0><s5>21</s5></fC03><fC03 i1="21" i2="X" l="SPA"><s0>Metadatos</s0><s5>21</s5></fC03><fC03 i1="22" i2="X" l="FRE"><s0>Thiophène dérivé polymère</s0><s2>NK</s2><s5>22</s5></fC03><fC03 i1="22" i2="X" l="ENG"><s0>Thiophene derivative polymer</s0><s2>NK</s2><s5>22</s5></fC03><fC03 i1="22" i2="X" l="SPA"><s0>Tiofeno derivado polímero</s0><s2>NK</s2><s5>22</s5></fC03><fC03 i1="23" i2="X" l="FRE"><s0>Acide butyrique</s0><s2>NK</s2><s5>23</s5></fC03><fC03 i1="23" i2="X" l="ENG"><s0>Butyric acid</s0><s2>NK</s2><s5>23</s5></fC03><fC03 i1="23" i2="X" l="SPA"><s0>Butírico ácido</s0><s2>NK</s2><s5>23</s5></fC03><fC03 i1="24" i2="X" l="FRE"><s0>Ester</s0><s5>24</s5></fC03><fC03 i1="24" i2="X" l="ENG"><s0>Ester</s0><s5>24</s5></fC03><fC03 i1="24" i2="X" l="SPA"><s0>Ester</s0><s5>24</s5></fC03><fC03 i1="25" i2="3" l="FRE"><s0>Composé du fullerène</s0><s5>25</s5></fC03><fC03 i1="25" i2="3" l="ENG"><s0>Fullerene compounds</s0><s5>25</s5></fC03><fC03 i1="26" i2="X" l="FRE"><s0>Oxyde d'indium</s0><s5>26</s5></fC03><fC03 i1="26" i2="X" l="ENG"><s0>Indium oxide</s0><s5>26</s5></fC03><fC03 i1="26" i2="X" l="SPA"><s0>Indio óxido</s0><s5>26</s5></fC03><fC03 i1="27" i2="X" l="FRE"><s0>Matériau revêtu</s0><s5>27</s5></fC03><fC03 i1="27" i2="X" l="ENG"><s0>Coated material</s0><s5>27</s5></fC03><fC03 i1="27" i2="X" l="SPA"><s0>Material revestido</s0><s5>27</s5></fC03><fC03 i1="28" i2="X" l="FRE"><s0>Verre flotté</s0><s5>28</s5></fC03><fC03 i1="28" i2="X" l="ENG"><s0>Float glass</s0><s5>28</s5></fC03><fC03 i1="28" i2="X" l="SPA"><s0>Vidrio flotado</s0><s5>28</s5></fC03><fC03 i1="29" i2="X" l="FRE"><s0>Ethylène téréphtalate polymère</s0><s2>NK</s2><s5>29</s5></fC03><fC03 i1="29" i2="X" l="ENG"><s0>Ethylene terephthalate polymer</s0><s2>NK</s2><s5>29</s5></fC03><fC03 i1="29" i2="X" l="SPA"><s0>Etileno tereftalato polímero</s0><s2>NK</s2><s5>29</s5></fC03><fC03 i1="30" i2="X" l="FRE"><s0>ITO</s0><s4>INC</s4><s5>82</s5></fC03><fC03 i1="31" i2="X" l="FRE"><s0>Procédé roll-to-roll</s0><s4>CD</s4><s5>96</s5></fC03><fC03 i1="31" i2="X" l="ENG"><s0>Roll-to-roll process</s0><s4>CD</s4><s5>96</s5></fC03><fN21><s1>175</s1></fN21><fN44 i1="01"><s1>OTO</s1></fN44><fN82><s1>OTO</s1></fN82></pA></standard></inist></record>Pour manipuler ce document sous Unix (Dilib)
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